F.J. Ridgeon
Self-field Effects on JC(B,T) Measurements of Nb-Ti Strands in High Magnetic Fields
Ridgeon, F.J.; Raine, M.J.; Lakrimi, M.; Thomas, A.; Boutboul, T.; Hampshire, D.P.
Authors
Dr Mark Raine m.j.raine@durham.ac.uk
Chief Experimental Officer
M. Lakrimi
A. Thomas
T. Boutboul
Professor Damian Hampshire d.p.hampshire@durham.ac.uk
Professor
Abstract
We have investigated the applied magnetic field, temperature, and self-field dependence of the critical current density of a Nb-Ti strand produced for the ITER Poloidal Field conductor. Measurements were made on a standard ITER barrel in magnetic fields from 4.0 to 8.0 T and temperatures from 3.5 to 6.0 K. We investigated the effect of self-field by changing the direction of the transport current, resulting in an inward or outward Lorentz force acting on the strand. At 4.2 K and 5 T, the difference in the measured JC between the two Lorentz force polarities was about 1%. From this low value, we conclude that self-field effects in the Nb-Ti strand are about 40 % of those expected using standard self-field calculations for fully transposed multifilamentary strands, consistent with theoretical considerations for annular filament transposition.
Citation
Ridgeon, F., Raine, M., Lakrimi, M., Thomas, A., Boutboul, T., & Hampshire, D. (2018). Self-field Effects on JC(B,T) Measurements of Nb-Ti Strands in High Magnetic Fields. IEEE Transactions on Applied Superconductivity, 28(4), Article 9001805. https://doi.org/10.1109/tasc.2018.2808370
Journal Article Type | Article |
---|---|
Acceptance Date | Feb 7, 2018 |
Online Publication Date | Feb 21, 2018 |
Publication Date | Jun 1, 2018 |
Deposit Date | Feb 8, 2018 |
Publicly Available Date | Mar 23, 2018 |
Journal | IEEE Transactions on Applied Superconductivity |
Print ISSN | 1051-8223 |
Electronic ISSN | 1558-2515 |
Publisher | Institute of Electrical and Electronics Engineers |
Peer Reviewed | Peer Reviewed |
Volume | 28 |
Issue | 4 |
Article Number | 9001805 |
DOI | https://doi.org/10.1109/tasc.2018.2808370 |
Public URL | https://durham-repository.worktribe.com/output/1339543 |
Related Public URLs | http://ieeexplore.ieee.org/document/8298512/ |
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Revised version © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
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