Jonathan D. Major
Focussed ion beam and field emission gun-scanning electron microscopy for the investigation of voiding and interface phenomena in thin-film solar cells
Major, Jonathan D.; Bowen, Leon; Durose, Ken
Citation
Major, J. D., Bowen, L., & Durose, K. (2011). Focussed ion beam and field emission gun-scanning electron microscopy for the investigation of voiding and interface phenomena in thin-film solar cells. Progress in Photovoltaics, 20(7), https://doi.org/10.1002/pip.1164
| Journal Article Type | Article |
|---|---|
| Publication Date | 2011 |
| Deposit Date | Jun 27, 2018 |
| Journal | Progress in Photovoltaics |
| Print ISSN | 1062-7995 |
| Electronic ISSN | 1099-159X |
| Publisher | Wiley |
| Volume | 20 |
| Issue | 7 |
| DOI | https://doi.org/10.1002/pip.1164 |
| Public URL | https://durham-repository.worktribe.com/output/1327776 |
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