Teruo Matsushita
Round Robin Test of Residual Resistance Ratio of Nb3Sn Composite Superconductors
Matsushita, Teruo; Otabe, Edmund S.; Kim, Dongho; Hwang, Taejong; Gao, Huixian; Liu, Fang; Liu, Huajun; Cooley, Lance; Turrioni, Daniele; Raine, Mark J.; Hampshire, Damian P.
Authors
Edmund S. Otabe
Dongho Kim
Taejong Hwang
Huixian Gao
Fang Liu
Huajun Liu
Lance Cooley
Daniele Turrioni
Dr Mark Raine m.j.raine@durham.ac.uk
Chief Experimental Officer
Damian P. Hampshire
Citation
Matsushita, T., Otabe, E. S., Kim, D., Hwang, T., Gao, H., Liu, F., …Hampshire, D. P. (2018). Round Robin Test of Residual Resistance Ratio of Nb3Sn Composite Superconductors. IEEE Transactions on Applied Superconductivity, 28(2), https://doi.org/10.1109/tasc.2017.2781182
| Journal Article Type | Article |
|---|---|
| Acceptance Date | Nov 21, 2017 |
| Online Publication Date | Mar 30, 2018 |
| Publication Date | 2018 |
| Deposit Date | Aug 30, 2018 |
| Journal | IEEE Transactions on Applied Superconductivity |
| Print ISSN | 1051-8223 |
| Electronic ISSN | 1558-2515 |
| Publisher | Institute of Electrical and Electronics Engineers |
| Peer Reviewed | Peer Reviewed |
| Volume | 28 |
| Issue | 2 |
| DOI | https://doi.org/10.1109/tasc.2017.2781182 |
| Public URL | https://durham-repository.worktribe.com/output/1321103 |
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