An Opening Profile Recognition Method for Magnetic Flux Leakage Signals of Defect

Huang, S.L.; Peng, L.S.; Wang, Q.; Wang, S.

Abstract

The defect opening profile recognition is of great concern in the magnetic flux leakage (MFL) measurement technique. The detected spatial MFL signal has three components: horizontal, vertical, and normal components. Horizontal and normal component signals are commonly used to estimate the defect profile, while the vertical component has always been neglected. With the development of the high resolution and the 3-D MFL testing techniques, the vertical component signal is becoming more available. This paper analyzes the essential right-angle features of the vertical component signal, which is useful for the defect opening profile recognition. After obtaining the initial profile from the horizontal or normal component, the types of the right angle is identified from the vertical component, and the opening profile is further optimized based on these right-angle features. The opening profile recognition method is put forward in this paper to improve the accuracy of the recognition result of the defect. Both simulation and experimental tests are conducted to verify the good performance of the proposed method. Compared with the opening profiles recognized merely by the horizontal component signal, the proposed method shows better recognition results, which also validates that the vertical component signal can also be a useful information for the defect estimation.

Citation

Huang, S., Peng, L., Wang, Q., & Wang, S. (2019). An Opening Profile Recognition Method for Magnetic Flux Leakage Signals of Defect. IEEE Transactions on Instrumentation and Measurement, 68(6), 2229-2236. https://doi.org/10.1109/tim.2018.2869438

• Journal Article Type: Article
• Acceptance Date: Aug 20, 2018
• Online Publication Date: Sep 26, 2018
• Publication Date: Jun 30, 2019
• Deposit Date: Sep 19, 2018
• Publicly Available Date: Sep 20, 2018
• Journal: IEEE Transactions on Instrumentation and Measurement
• Print ISSN: 0018-9456
• Electronic ISSN: 1557-9662
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 68
• Issue: 6
• Pages: 2229-2236
• DOI: https://doi.org/10.1109/tim.2018.2869438
• Public URL: https://durham-repository.worktribe.com/output/1319033