Conduction mechanisms in metal/self-assembled monolayer/metal junctions

Etor, David; Dodd, Linzi E.; Balocco, Claudio; Wood, David

Abstract

The conduction mechanisms in metal-insulator-metal (MIM) junctions where the insulator consists of a self-assembled monolayer are investigated. Temperature dependence measurements from 2.5 to 300 K, show that the conduction is dominated by tunnelling only for temperatures below 20 K, while at higher temperatures surface-limited and bulk-limited mechanisms are observed. The experimental results are explained using a combination of direct (Simmons) tunnelling, Schottky emission, and Poole-Frenkel theory. Further insight is gained through numerical simulations based on the non-equilibrium Green-function formalism.

Citation

Etor, D., Dodd, L. E., Balocco, C., & Wood, D. (2019). Conduction mechanisms in metal/self-assembled monolayer/metal junctions. Micro and Nano Letters, 14(7), 808-811. https://doi.org/10.1049/mnl.2018.5747

• Journal Article Type: Article
• Publication Date: Jun 26, 2019
• Deposit Date: Nov 15, 2019
• Publicly Available Date: Nov 18, 2019
• Journal: Micro and Nano Letters
• Electronic ISSN: 1750-0443
• Publisher: Institution of Engineering and Technology (IET)
• Peer Reviewed: Peer Reviewed
• Volume: 14
• Issue: 7
• Pages: 808-811
• DOI: https://doi.org/10.1049/mnl.2018.5747
• Public URL: https://durham-repository.worktribe.com/output/1313818
• Related Public URLs: http://nrl.northumbria.ac.uk/38224