David Etor
Conduction mechanisms in metal/self-assembled monolayer/metal junctions
Etor, David; Dodd, Linzi E.; Balocco, Claudio; Wood, David
Abstract
The conduction mechanisms in metal-insulator-metal (MIM) junctions where the insulator consists of a self-assembled monolayer are investigated. Temperature dependence measurements from 2.5 to 300 K, show that the conduction is dominated by tunnelling only for temperatures below 20 K, while at higher temperatures surface-limited and bulk-limited mechanisms are observed. The experimental results are explained using a combination of direct (Simmons) tunnelling, Schottky emission, and Poole-Frenkel theory. Further insight is gained through numerical simulations based on the non-equilibrium Green-function formalism.
Journal Article Type | Article |
---|---|
Publication Date | Jun 26, 2019 |
Deposit Date | Nov 15, 2019 |
Publicly Available Date | Nov 18, 2019 |
Journal | Micro and Nano Letters |
Publisher | Institution of Engineering and Technology (IET) |
Peer Reviewed | Peer Reviewed |
Volume | 14 |
Issue | 7 |
Pages | 808-811 |
DOI | https://doi.org/10.1049/mnl.2018.5747 |
Public URL | https://durham-repository.worktribe.com/output/1313818 |
Related Public URLs | http://nrl.northumbria.ac.uk/38224 |
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Copyright Statement
This paper is an accepted manuscript of a paper submitted to and accepted for publication in Micro & Nano Letters and is subject to Institution of Engineering and Technology Copyright. The copy of record is available at IET Digital Library.
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