Benjamin T. Beswick
Lattice-depth measurement using multipulse atom diffraction in and beyond the weakly diffracting limit
Beswick, Benjamin T.; Hughes, Ifan G.; Gardiner, Simon A.
Professor Ifan Hughes email@example.com
Professor Simon Gardiner firstname.lastname@example.org
Precise knowledge of optical lattice depths is important for a number of areas of atomic physics, most notably in quantum simulation, atom interferometry, and for the accurate determination of transition matrix elements. In such experiments, lattice depths are often measured by exposing an ultracold atomic gas to a series of off-resonant laser-standing-wave pulses, and fitting theoretical predictions for the fraction of atoms found in each of the allowed momentum states by time-of-flight measurement, after some number of pulses. We present a full analytic model for the time evolution of the atomic populations of the lowest momentum states, which is sufficient for a “weak” lattice, as well as numerical simulations incorporating higher momentum states for both relatively strong and weak lattices. Finally, we consider the situation where the initial gas is explicitly assumed to be at a finite temperature.
Beswick, B. T., Hughes, I. G., & Gardiner, S. A. (2019). Lattice-depth measurement using multipulse atom diffraction in and beyond the weakly diffracting limit. Physical Review A, 99(1), Article 013614. https://doi.org/10.1103/physreva.99.013614
|Journal Article Type||Article|
|Acceptance Date||Dec 7, 2018|
|Online Publication Date||Jan 16, 2019|
|Publication Date||Jan 16, 2019|
|Deposit Date||Jan 16, 2019|
|Publicly Available Date||Jan 18, 2019|
|Journal||Physical Review A|
|Publisher||American Physical Society|
|Peer Reviewed||Peer Reviewed|
Published Journal Article
Publisher Licence URL
Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.
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