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A CMOS SPAD Line Sensor With Per-Pixel Histogramming TDC for Time-Resolved Multispectral Imaging

Erdogan, Ahmet T.; Walker, Richard; Finlayson, Neil; Krstajic, Nikola; Williams, Gareth; Girkin, John; Henderson, Robert

A CMOS SPAD Line Sensor With Per-Pixel Histogramming TDC for Time-Resolved Multispectral Imaging Thumbnail


Authors

Ahmet T. Erdogan

Richard Walker

Neil Finlayson

Nikola Krstajic

Gareth Williams

Robert Henderson



Abstract

A 512 × 16 single photon avalanche diode (SPAD)-based line sensor is designed in a 0.13- μm CMOS image sensor technology for time-resolved multispectral beam scanned imaging. The sensor has 23.78- μm pixel pitch and incorporates one SPAD array with 49.31% fill factor optimized for detection in the blue–green spectral region, and a second array at 15.75% fill factor optimized for the red-near-infrared response spectral region. Each pixel contains a 32-bin histogramming time-to-digital converter (TDC) with a mean time resolution of 51.20 ps. Histogram bin resolutions are adjustable from 51.20 ps to 6.55 ns per bin. The line sensor can operate in single photon counting (SPC) mode (102.1 giga-events/s), time-correlated SPC (TCSPC) mode (192.4 million-events/s) or on-chip histogramming mode (16.5 giga-events/s), increasing the count rate up to 85 times compared to TCSPC mode. Sensor capability is demonstrated through spectral fluorescence lifetime imaging, resolving three fluorophore populations with distinct fluorophore lifetimes.

Citation

Erdogan, A. T., Walker, R., Finlayson, N., Krstajic, N., Williams, G., Girkin, J., & Henderson, R. (2019). A CMOS SPAD Line Sensor With Per-Pixel Histogramming TDC for Time-Resolved Multispectral Imaging. IEEE Journal of Solid-State Circuits, 54(6), 1705-1719. https://doi.org/10.1109/jssc.2019.2894355

Journal Article Type Article
Acceptance Date Jan 6, 2019
Online Publication Date May 26, 2019
Publication Date May 31, 2019
Deposit Date May 28, 2019
Publicly Available Date May 28, 2019
Journal IEEE Journal of Solid-State Circuits
Print ISSN 0018-9200
Electronic ISSN 1558-173X
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 54
Issue 6
Pages 1705-1719
DOI https://doi.org/10.1109/jssc.2019.2894355
Public URL https://durham-repository.worktribe.com/output/1300674

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© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.






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