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A solution to the parameter selection and current static error issues with frequency shift islanding detection methods

Liu, M.H; Zhao, W.; Wang, Q.; Huang, S.L.; Shi, K.P.

A solution to the parameter selection and current static error issues with frequency shift islanding detection methods Thumbnail


Authors

M.H Liu

W. Zhao

S.L. Huang

K.P. Shi



Abstract

Frequency shift islanding detection methods have been widely used in inverter-based distributed generations. Two representatives of such methods, Sandia frequency shift (SFS) and reactive current perturbation (RCP) methods, are investigated in this paper. The investigation reveals two main issues with these two methods, i.e., parameter selection scheme for positive feedback gain and current static error. The current parameter selection scheme, in particular, is considered unreliable and inconvenient in this paper, for it has not considered the weakening effect of PI regulators on positive feedback and the positive feedback gain is actually obtained by trial and error, which makes it difficult to use such methods well in field environments. In view of these issues, this paper proposes a solution that contains an improved method to eliminate current static error and a reliable and convenient parameter selection scheme based on system stability analyses. The final simulations and experiments verify the good performance of the improved method and the parameter selection scheme.

Citation

Liu, M., Zhao, W., Wang, Q., Huang, S., & Shi, K. (2020). A solution to the parameter selection and current static error issues with frequency shift islanding detection methods. IEEE Transactions on Industrial Electronics, 68(2), 1401-1411. https://doi.org/10.1109/tie.2020.2970684

Journal Article Type Article
Acceptance Date Dec 30, 2019
Online Publication Date Feb 5, 2020
Publication Date 2020
Deposit Date Dec 31, 2019
Publicly Available Date Jan 3, 2020
Journal IEEE Transactions on Industrial Electronics
Print ISSN 0278-0046
Electronic ISSN 1557-9948
Publisher Institute of Electrical and Electronics Engineers
Peer Reviewed Peer Reviewed
Volume 68
Issue 2
Pages 1401-1411
DOI https://doi.org/10.1109/tie.2020.2970684
Public URL https://durham-repository.worktribe.com/output/1280865

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