Professor Buddhika Mendis b.g.mendis@durham.ac.uk
Professor
Towards Electron Energy Loss Compton Spectra Free From Dynamical Diffraction Artifacts
Mendis, Budhika G.; Talmantaite, Alina
Authors
Alina Talmantaite
Abstract
The Compton signal in electron energy loss spectroscopy (EELS) is used to determine the projected electron momentum density of states for the solid. A frequent limitation however is the strong dynamical scattering of the incident electron beam within a crystalline specimen, i.e. Bragg diffracted beams can be additional sources of Compton scattering that distort the measured profile from its true shape. The Compton profile is simulated via a multislice method that models dynamical scattering both before and after the Compton energy loss event. Simulations indicate the importance of both the specimen illumination condition and EELS detection geometry. Based on this, a strategy to minimize diffraction artifacts is proposed and verified experimentally. Furthermore, an inversion algorithm to extract the projected momentum density of states from a Compton measurement performed under strong diffraction conditions is demonstrated. The findings enable a new route to more accurate electron Compton data from crystalline specimens.
Citation
Mendis, B. G., & Talmantaite, A. (2022). Towards Electron Energy Loss Compton Spectra Free From Dynamical Diffraction Artifacts. Microscopy and Microanalysis, 28(6), 1971–1980. https://doi.org/10.1017/s1431927622012223
Journal Article Type | Article |
---|---|
Acceptance Date | Jun 26, 2022 |
Online Publication Date | Dec 1, 2022 |
Publication Date | 2022-12 |
Deposit Date | Sep 21, 2022 |
Publicly Available Date | Sep 22, 2022 |
Journal | Microscopy and Microanalysis |
Print ISSN | 1431-9276 |
Electronic ISSN | 1435-8115 |
Publisher | Cambridge University Press |
Peer Reviewed | Peer Reviewed |
Volume | 28 |
Issue | 6 |
Pages | 1971–1980 |
DOI | https://doi.org/10.1017/s1431927622012223 |
Public URL | https://durham-repository.worktribe.com/output/1194111 |
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© The Author(s), 2022. Published by Cambridge University Press on behalf of the Microscopy Society of America. This is an Open Access article, distributed under the terms of the
Creative Commons Attribution licence (https://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the
original work is properly cited.
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Publisher Licence URL
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