N. Bhowmik
On the Impact of Object and Sub-Component Level Segmentation Strategies for Supervised Anomaly Detection within X-Ray Security Imagery
Bhowmik, N.; Gaus, Y.F.A.; Akcay, S.; Barker, J.W.; Breckon, T.P.
Abstract
X-ray security screening is in widespread use to maintain transportation security against a wide range of potential threat profiles. Of particular interest is the recent focus on the use of automated screening approaches, including the potential anomaly detection as a methodology for concealment detection within complex electronic items. Here we address this problem considering varying segmentation strategies to enable the use of both object level and sub-component level anomaly detection via the use of secondary convolutional neural network (CNN) architectures. Relative performance is evaluated over an extensive dataset of exemplar cluttered X-ray imagery, with a focus on consumer electronics items. We find that sub-component level segmentation produces marginally superior performance in the secondary anomaly detection via classification stage, with true positive of ~98% of anomalies, with a ~3% false positive.
Citation
Bhowmik, N., Gaus, Y., Akcay, S., Barker, J., & Breckon, T. (2019, December). On the Impact of Object and Sub-Component Level Segmentation Strategies for Supervised Anomaly Detection within X-Ray Security Imagery. Presented at 18th IEEE International Conference on Machine Learning and Applications (ICMLA 2019), Boca Raton, Florida, USA
Presentation Conference Type | Conference Paper (published) |
---|---|
Conference Name | 18th IEEE International Conference on Machine Learning and Applications (ICMLA 2019) |
Start Date | Dec 16, 2019 |
End Date | Dec 19, 2019 |
Acceptance Date | Sep 21, 2019 |
Online Publication Date | Feb 17, 2020 |
Publication Date | 2019 |
Deposit Date | Dec 20, 2019 |
Publicly Available Date | Jun 4, 2020 |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 986-991 |
Book Title | 2019 18th IEEE International Conference On Machine Learning And Applications (ICMLA), Boca Raton, FL, USA, 2019. |
DOI | https://doi.org/10.1109/icmla.2019.00168 |
Public URL | https://durham-repository.worktribe.com/output/1142767 |
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© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
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