Material Characterization with Frequency Domain THz Ellipsometry

Klein, Andreas K.; Stefanova, Polina S.; Gallant, Andrew; Balocco, Claudio

doi:10.1109/irmmw-thz.2018.8510238

Material Characterization with Frequency Domain THz Ellipsometry

Klein, Andreas K.; Stefanova, Polina S.; Gallant, Andrew; Balocco, Claudio

Authors

Andreas K. Klein

Polina S. Stefanova

Professor Andrew Gallant a.j.gallant@durham.ac.uk
Professor

Claudio Balocco

Citation

Klein, A. K., Stefanova, P. S., Gallant, A., & Balocco, C. (2018, December). Material Characterization with Frequency Domain THz Ellipsometry. Presented at 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

Presentation Conference Type	Conference Paper (published)
Conference Name	2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
Online Publication Date	Sep 9, 2018
Publication Date	2018
Deposit Date	Apr 1, 2019
Publisher	Institute of Electrical and Electronics Engineers
DOI	https://doi.org/10.1109/irmmw-thz.2018.8510238
Public URL	https://durham-repository.worktribe.com/output/1142385

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