Andreas K. Klein
Material Characterization with Frequency Domain THz Ellipsometry
Klein, Andreas K.; Stefanova, Polina S.; Gallant, Andrew; Balocco, Claudio
Authors
Citation
Klein, A. K., Stefanova, P. S., Gallant, A., & Balocco, C. (2018, December). Material Characterization with Frequency Domain THz Ellipsometry. Presented at 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
| Presentation Conference Type | Conference Paper (published) |
|---|---|
| Conference Name | 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) |
| Online Publication Date | Sep 9, 2018 |
| Publication Date | 2018 |
| Deposit Date | Apr 1, 2019 |
| Publisher | Institute of Electrical and Electronics Engineers |
| DOI | https://doi.org/10.1109/irmmw-thz.2018.8510238 |
| Public URL | https://durham-repository.worktribe.com/output/1142385 |
You might also like
Scattering of spoof surface plasmon polaritons in defect-rich THz waveguides
(2019)
Journal Article
Ultra-Low-Cost THz Wave Plates Based on High-Contrast Gratings
(2018)
Presentation / Conference Contribution
Channel Characterisation at THz Frequencies for High Data Rate Indoor Communications
(2018)
Presentation / Conference Contribution
Paper-based Optical Components for the THz Region
(2018)
Presentation / Conference Contribution
Evolutionary Optimisation of THz components
(2018)
Presentation / Conference Contribution