Spontaneous Magnetization In A Sulfur-nitrogen Radical At 36 K
(1996)
Journal Article
Banister, A., Bricklebank, N., Lavender, I., Rawson, J., Gregory, C., Tanner, B., …Palacio, F. (1996). Spontaneous Magnetization In A Sulfur-nitrogen Radical At 36 K. Angewandte Chemie International Edition, 35, 2533-2535
Outputs (369)
X-ray and magnetoresistance measurements of annealed Co/Cu multilayers (1996)
Journal Article
Hickey, B., Laidler, H., Pape, I., Gregory, C., & Tanner, B. (1996). X-ray and magnetoresistance measurements of annealed Co/Cu multilayers. Journal of Magnetism and Magnetic Materials, 154, 165-174
Giant magnetoresistance and interface structure of Cu/Co multilayers grown by MBE on Si (111) substrates with copper-silicide buffers (1996)
Journal Article
Tanner, B., Pape, I., Hase, T., Laidler, H., Emmerson, C., Hickey, B., & Shen, T. (1996). Giant magnetoresistance and interface structure of Cu/Co multilayers grown by MBE on Si (111) substrates with copper-silicide buffers. Journal of Magnetism and Magnetic Materials, 156, 373-374
ERRATUM: Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction (1996)
Journal Article
Möck, P., Tanner, B., Li, C., Keir, A., Johnson, A., Lacey, G., …Hogg, J. (1996). ERRATUM: Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction. Semiconductor Science and Technology, 11, 1363-
The Effect Of Carbon Content On The Magnetisation Of Steel (1996)
Book Chapter
Makar, J., & Tanner, B. (1996). The Effect Of Carbon Content On The Magnetisation Of Steel. In A. Moses, & A. Basak (Eds.), Nonlinear Electromagnetic Systems (472-475). I O S PRESS
Contrast Of Defects In X-ray Diffraction Topographs (1996)
Book Chapter
Tanner, B. (1996). Contrast Of Defects In X-ray Diffraction Topographs. In A. Authier, S. Lagomarsino, & B. K. Tanner (Eds.), X-Ray and Neutron Dynamical Diffraction, Theory and Applications (147-166). PLENUM PRESS DIV PLENUM PUBLISHING CORP
Effect of annealing on the roughness and GMR of Fe/Cr multilayers (1996)
Journal Article
Hickey, B., Laidler, H., Hase, T., Tanner, B., Schad, R., & Bruynseraede, Y. (1996). Effect of annealing on the roughness and GMR of Fe/Cr multilayers. Journal of Magnetism and Magnetic Materials, 156, 332-334
Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction (1996)
Journal Article
Möck, P., Tanner, B., Li, C., Keir, A., Johnson, A., Lacey, G., …Hogg, J. (1996). Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction. Semiconductor Science and Technology, 11, 1051-1055
Simulation Of Decorated Dislocation Images In X-ray Section Topographs (1996)
Journal Article
Holland, A., & Tanner, B. (1996). Simulation Of Decorated Dislocation Images In X-ray Section Topographs. Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 73, 1451-1474
In situ X-ray topography studies during the molecular beam epitaxy growth of InGaAs on (001) GaAs: effects of substrate dislocation distribution on strain relaxation (1995)
Journal Article
Barnett, S., Keir, A., Cullis, A., Johnson, A., Jefferson, J., Smith, G., …Castelli, C. (1995). In situ X-ray topography studies during the molecular beam epitaxy growth of InGaAs on (001) GaAs: effects of substrate dislocation distribution on strain relaxation. Journal of Physics D: Applied Physics, 28, A17-A22