High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy
(1999)
Journal Article
Moore, C., & Tanner, B. (1999). High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 357, 2801-
Outputs (15)
Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation (1999)
Journal Article
Mizuno, K., Mock, P., Tanner, B., Lacey, G., Whitehouse, C., Smith, G., & Keir, A. (1999). Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation. Journal of Crystal Growth, 199, 1146-1150
Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity (1999)
Journal Article
Stolojan, V., Brown, L., Ferrari, A., Robertson, J., Bassi, A., & Tanner, B. (1999). Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity. Institute of physics conference series, 161, 361-364
Influence of step-bunching on grazing incidence diffuse x-ray scattering (1999)
Journal Article
Clarke, J., Pape, I., Tanner, B., & Wormington, M. (1999). Influence of step-bunching on grazing incidence diffuse x-ray scattering. Journal of Physics: Condensed Matter, 11, 2661-2668
Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction (1999)
Journal Article
Bottani, C., Li Bassi, A., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (1999). Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction. Physical Review B, 59, 15601-