A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy
(2017)
Journal Article
Nazarenko, M., Rosamond, M. C., Gallant, A. J., Kolosov, O. V., Dubrovskii, V. G., & Zeze, D. A. (2017). A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy. Journal of Physics D: Applied Physics, 50(49), Article 494004. https://doi.org/10.1088/1361-6463/aa900e
Scanning thermal microscopy (SThM) is an attractive technique for nanoscale thermal measurements. Multiwalled carbon nanotubes (MWCNT) can be used to enhance a SThM probe in order to drastically increase spatial resolution while keeping required ther... Read More about A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy.