Brian Tanner's Outputs (13)

Density And Sp(3) Content In Diamond-like Carbon Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy (2000)
Journal Article
Libassi, A., Ferrari, A., Stolojan, V., Tanner, B., Robertson, J., & Brown, L. (2000). Density And Sp(3) Content In Diamond-like Carbon Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy. MRS proceedings, 593, 293-298

Determination Of Bonding In Amorphous Carbons By Electron Energy Loss Spectroscopy, Raman Scattering And X-ray Reflectivity (2000)
Journal Article
Ferrari, A., Kleinsorge, B., Adamopoulos, G., Robertson, J., Milne, W., Stolojan, V., …Tanner, B. (2000). Determination Of Bonding In Amorphous Carbons By Electron Energy Loss Spectroscopy, Raman Scattering And X-ray Reflectivity. Journal of Non-Crystalline Solids, 266, 765-768

Evaluation Of Polishing Damage In Alumina (2000)
Journal Article
Pape, I., Lawrence, C., Warren, P., Roberts, S., Briggs, G., Kolosov, O., …Tanner, B. (2000). Evaluation Of Polishing Damage In Alumina. Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 80, 1913-1934. https://doi.org/10.1080/01418610008219094

Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers (2000)
Journal Article
Hase, T., Pape, I., Tanner, B., Dürr, H., Dudzik, E., van der Laan, G., …Hickey, B. (2000). Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers. Physical Review B, 61, 3792-

Density, sp³ fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy (2000)
Journal Article
Ferrari, A., Libassi, A., Tanner, B., Stolojan, V., Yuan, J., Brown, L., …Robertson, J. (2000). Density, sp³ fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy. Physical Review B, 62, 11089-11103

Soft x-ray magnetic scattering evidence for biquadratic coupling in Co/Cu multilayers (2000)
Journal Article
Hase, T., Pape, I., Read, D., Tanner, B., Dürr, H., Dudzik, E., …Hickey, B. (2000). Soft x-ray magnetic scattering evidence for biquadratic coupling in Co/Cu multilayers. Physical Review B, 61, 15331-15337

X-ray scattering studies of 2H-NbSe₂, a superconductor and charge density wave material, under high external magnetic fields (2000)
Journal Article
Du, C., Lin, W., Su, Y., Tanner, B., Hatton, P., Casa, D., …Hohl, H. (2000). X-ray scattering studies of 2H-NbSe₂, a superconductor and charge density wave material, under high external magnetic fields. Journal of Physics: Condensed Matter, 12, 5361-5370

Density, Sp(3) Content And Internal Layering Of Dlc Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy (2000)
Journal Article
Libassi, A., Ferrari, A., Stolojan, V., Tanner, B., Robertson, J., & Brown, L. (2000). Density, Sp(3) Content And Internal Layering Of Dlc Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy. Diamond and Related Materials, 9, 771-776

Damage caused to interlayer coupling of magnetic multilayers by residual gases (2000)
Journal Article
Marrows, C., Hickey, B., Herrmann, M., McVitie, S., Chapman, J., Ormston, M., …Tanner, B. (2000). Damage caused to interlayer coupling of magnetic multilayers by residual gases. Physical Review B, 61, 4131-4140

The effect of plastic deformation and residual stress on the permeability and magnetostriction of steels (2000)
Journal Article
Makar, J., & Tanner, B. (2000). The effect of plastic deformation and residual stress on the permeability and magnetostriction of steels. Journal of Magnetism and Magnetic Materials, 222, 291-304

Characterization Of Oxide Layers On Gaas Substrates (2000)
Journal Article
Allwood, D., Carline, R., Mason, N., Pickering, C., Tanner, B., & Walker, P. (2000). Characterization Of Oxide Layers On Gaas Substrates. Thin Solid Films, 364, 33-39

The origin of the redshift in Brillouin spectra of silica films containing tin nanoparticles (2000)
Journal Article
Li Bassi, A., Bottani, C., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (2000). The origin of the redshift in Brillouin spectra of silica films containing tin nanoparticles. The European Physical Journal C, 18, 31-38

Dependence of the critical thickness on Si doping of InGaAs on GaAs (2000)
Journal Article
Tanner, B., Parbrook, P., Whitehouse, C., Keir, A., Johnson, A., Jones, J., …Hogg, J. (2000). Dependence of the critical thickness on Si doping of InGaAs on GaAs. Applied Physics Letters, 77, 2156-2158