Quantitative reflectivity measurements
(1978)
Journal Article
Tanner, B. (1978). Quantitative reflectivity measurements. Physics Education, 13, 120-122
Brian Tanner's Outputs (6)
Application Of X-ray Synchrotron Topography To Insitu Studies Of Recrystallization (1978)
Journal Article
Maccormack, I., & Tanner, B. (1978). Application Of X-ray Synchrotron Topography To Insitu Studies Of Recrystallization. Journal of Applied Crystallography, 11, 40-43
γ-ray diffractometry of lattice distortions in TbVO₄ caused by the Jahn-Teller phase transition (1978)
Journal Article
Smith, S., & Tanner, B. (1978). γ-ray diffractometry of lattice distortions in TbVO₄ caused by the Jahn-Teller phase transition. Journal of physics. C. Solid state physics, 11, L717-L720
Domain configurations in single crystal TbFe₂ and Tb<SUB>0.27</SUB>Dy<SUB>0.73</SUB>Fe₂ (1978)
Journal Article
Sery, R., Savage, H., Tanner, B., & Clark, G. (1978). Domain configurations in single crystal TbFe₂ and Tb0.27Dy0.73Fe₂. Journal of Applied Physics, 49, 2010-2012
Flux Growth And Characterization By X-ray Topography Of Rare-earth Arsenates (1978)
Journal Article
Smith, S., Garton, G., Tanner, B., & Midgley, D. (1978). Flux Growth And Characterization By X-ray Topography Of Rare-earth Arsenates. Journal of Materials Science, 13, 620-626
Anti-ferromagnetic Domain-wall Motion In Knif3 And Kcof3 Observed By X-ray Synchrotron Topography (1978)
Journal Article
Safa, M., & Tanner, B. (1978). Anti-ferromagnetic Domain-wall Motion In Knif3 And Kcof3 Observed By X-ray Synchrotron Topography. Philosophical magazine. B. Physics of condensed matter. Electronic, optical and magnetic properties, 37, 739-750