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Brian Tanner's Outputs (2)

High resolution divergent-beam X-ray topography (1970)
Journal Article
Tanner, B. K., & Humphreys, C. J. (1970). High resolution divergent-beam X-ray topography. Journal of Physics D: Applied Physics, 3(7), 1144-1146. https://doi.org/10.1088/0022-3727/3/7/421

The resolution and contrast of divergent-beam x-ray topographs is discussed. It is shown that tungsten Lα radiation can be used to reduce exposures and the x-ray examination of thinned electron microscope specimens is demonstrated.