All Outputs (15)

Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction (1999)
Journal Article
Bottani, C., Li Bassi, A., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (1999). Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction. Physical Review B, 59, 15601-

Influence of step-bunching on grazing incidence diffuse x-ray scattering (1999)
Journal Article
Clarke, J., Pape, I., Tanner, B., & Wormington, M. (1999). Influence of step-bunching on grazing incidence diffuse x-ray scattering. Journal of Physics: Condensed Matter, 11, 2661-2668

Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity (1999)
Journal Article
Stolojan, V., Brown, L., Ferrari, A., Robertson, J., Bassi, A., & Tanner, B. (1999). Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity. Institute of physics conference series, 161, 361-364

Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation (1999)
Journal Article
Mizuno, K., Mock, P., Tanner, B., Lacey, G., Whitehouse, C., Smith, G., & Keir, A. (1999). Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation. Journal of Crystal Growth, 199, 1146-1150

High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy (1999)
Journal Article
Moore, C., & Tanner, B. (1999). High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 357, 2801-

Guest Editor's introduction (1999)
Journal Article
Tanner, B. (1999). Guest Editor's introduction. Journal of Physics D: Applied Physics, 32, A1-A2

Strain Relaxation In Ingaas Epilayers On Gaas By Means Of Twin Formation (1999)
Journal Article
Moeck, P., Mizuno, K., Tanner, B., Lacey, G., Whitehouse, C., Smith, G., & Keir, A. (1999). Strain Relaxation In Ingaas Epilayers On Gaas By Means Of Twin Formation. Japanese Journal of Applied Physics, 38, 3628-3631

The progression of interface structure through sputtered Co/Cu and Co/Pt multilayer films (1999)
Journal Article
Fulthorpe, B., Joyce, D., Hase, T., Rozatian, A., Tanner, B., & Grundy, P. (1999). The progression of interface structure through sputtered Co/Cu and Co/Pt multilayer films. Journal of Physics: Condensed Matter, 11, 8477-8487

X-ray optics of in situ synchrotron topography of InGaAs on GaAs (1999)
Journal Article
Tanner, B., Keir, A., Möck, P., Whitehouse, C., Lacey, G., Johnson, A., …Clark, G. (1999). X-ray optics of in situ synchrotron topography of InGaAs on GaAs. Journal of Physics D: Applied Physics, 32, A119-A122

Preface to X-ray topography and cystal characterization. A Theme issue published by The Royal Society. (1999)
Journal Article
Bowen, D., & Tanner, B. (1999). Preface to X-ray topography and cystal characterization. A Theme issue published by The Royal Society. Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 357, 2629-

Giant magnetoresistance and oscillatory exchange coupling in disordered Co/Cu multilayers (1999)
Journal Article
Marrows, C., Wiser, N., Hickey, B., Hase, T., & Tanner, B. (1999). Giant magnetoresistance and oscillatory exchange coupling in disordered Co/Cu multilayers. Journal of Physics: Condensed Matter, 11, 81-88

The effect of conformal roughness on spin-valves (1999)
Journal Article
Clarke, J., Marrows, C., Stanley, F., Bunyan, R., Tanner, B., & Hickey, B. (1999). The effect of conformal roughness on spin-valves. Journal of Physics D: Applied Physics, 32, 1169-1174

X-ray Characterisation Of Indium Phosphide Substrates (1999)
Journal Article
Moore, C., & Tanner, B. (1999). X-ray Characterisation Of Indium Phosphide Substrates. Materials Science and Engineering: B, 66, 11-14

Grazing Incidence X-ray Scattering Measurement Of Silicate Glass Surfaces (1999)
Journal Article
Pape, I., Tanner, B., & Wormington, M. (1999). Grazing Incidence X-ray Scattering Measurement Of Silicate Glass Surfaces. Journal of Non-Crystalline Solids, 248, 75-83

Characterisation Of Cadmium Telluride Bulk Crystals Grown By A Novel "multi-tube" Vapour Growth Technique (1999)
Journal Article
Aitken, N., Potter, M., Buckley, D., Mullins, J., Carles, J., Halliday, D., …Brinkman, A. (1999). Characterisation Of Cadmium Telluride Bulk Crystals Grown By A Novel "multi-tube" Vapour Growth Technique. Journal of Crystal Growth, 199, 984-987. https://doi.org/10.1016/s0022-0248%2898%2901138-5