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Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole and fluorene units (2013)
Journal Article
Pearson, C., Bowen, L., Lee, M., Fisher, A., Linton, K., Bryce, M., & Petty, M. (2013). Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole and fluorene units. Applied Physics Letters, 102(21), https://doi.org/10.1063/1.4808026

We report on the mechanism of operation of organic thin film resistive memory architectures based on an ambipolar compound consisting of oxadiazole, carbazole, and fluorene units. Cross-sections of the devices have been imaged by electron microscopy... Read More about Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole and fluorene units.

The structure of volcanic cristobalite in relation to its toxicity; relevance for the variable crystalline silica hazard (2012)
Journal Article
Horwell, C., Williamson, B., Donaldson, K., Le Blond, J., Damby, D., & Bowen, L. (2012). The structure of volcanic cristobalite in relation to its toxicity; relevance for the variable crystalline silica hazard. Particle and Fibre Toxicology, 9, Article 44. https://doi.org/10.1186/1743-8977-9-44

Background: Respirable crystalline silica (RCS) continues to pose a risk to human health worldwide. Its variable toxicity depends on inherent characteristics and external factors which influence surface chemistry. Significant population exposure to R... Read More about The structure of volcanic cristobalite in relation to its toxicity; relevance for the variable crystalline silica hazard.

A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics (2010)
Journal Article
Mendis, B., Bowen, L., & Jiang, Q. (2010). A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics. Applied Physics Letters, 97(9), Article 092112. https://doi.org/10.1063/1.3486482

A cathodoluminescence-based, contactless method for extracting the bulk minority carrier diffusion length and reduced recombination velocity of an individual grain boundary is applied to vapor grown CdTe epitaxial films. The measured diffusion length... Read More about A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics.

Self-catalyzed, pure zincblende GaAs nanowires grown on Si(111) by molecular beam epitaxy (2010)
Journal Article
Cirlin, G., Dubrovskii, V., Samsonenko, Y., Bouravleuv, A., Durose, K., Proskruryakov, Y., Mendes, B., Bowen, L., Kaliteevski, M., Abram, R., & Zeze, D. (2010). Self-catalyzed, pure zincblende GaAs nanowires grown on Si(111) by molecular beam epitaxy. Physical review B - Condensed Matter and Materials Physics, 82(3), Article 035302. https://doi.org/10.1103/physrevb.82.035302

We report on the Au-free molecular beam epitaxy growth of coherent GaAs nanowires directly on Si(111) substrates. The growth is catalyzed by liquid Ga droplets formed in the openings of a native oxide layer at the initial growth stage. Transmission e... Read More about Self-catalyzed, pure zincblende GaAs nanowires grown on Si(111) by molecular beam epitaxy.