Semi-supervised Object-Wise Anomaly Detection for Firearm and Firearm Component Detection in X-ray Security Imagery

Gaus, Y. F. A.; Isaac-Medina, B. K. S.; Bhowmik, N.; Lam, Y. T.; Breckon, T. P.

Semi-supervised Object-Wise Anomaly Detection for Firearm and Firearm Component Detection in X-ray Security Imagery

Gaus, Y. F. A.; Isaac-Medina, B. K. S.; Bhowmik, N.; Lam, Y. T.; Breckon, T. P.

Authors

Yona Binti Abd Gaus yona.f.binti-abd-gaus@durham.ac.uk
Post Doctoral Research Associate

Brian Isaac Medina brian.k.isaac-medina@durham.ac.uk
Postdoctoral Research Associate

Dr Neelanjan Bhowmik neelanjan.bhowmik@durham.ac.uk
Post Doctoral Research Associate

Y. T. Lam

Professor Toby Breckon toby.breckon@durham.ac.uk
Professor

Citation

Gaus, Y. F. A., Isaac-Medina, B. K. S., Bhowmik, N., Lam, Y. T., & Breckon, T. P. (2025, June). Semi-supervised Object-Wise Anomaly Detection for Firearm and Firearm Component Detection in X-ray Security Imagery. Presented at 2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW), Nashville, Tennessee, USA

Presentation Conference Type	Conference Paper (published)
Conference Name	2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
Start Date	Jun 11, 2025
End Date	Jun 15, 2025
Acceptance Date	Mar 31, 2025
Deposit Date	Apr 12, 2025
Publisher	Institute of Electrical and Electronics Engineers
Peer Reviewed	Peer Reviewed
Keywords	firearm detection, prohibited item detection, APIDS, anomaly, out-of-distribution, OOD, OWOD, open-world object detection
Public URL	https://durham-repository.worktribe.com/output/3790211
Publisher URL	https://ieeexplore.ieee.org/xpl/conhome/1001809/all-proceedings