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A field programmable gate array based Langmuir probe system for measurement of plasma parameters at 500 kHz in a high-power impulse magnetron sputtering plasma.

Hickling, C J; Hall, S; Harrison, J R; Sharples, R; Bradley, J W

A field programmable gate array based Langmuir probe system for measurement of plasma parameters at 500 kHz in a high-power impulse magnetron sputtering plasma. Thumbnail


Authors

C J Hickling

S Hall

J R Harrison

J W Bradley



Abstract

By utilizing Field Programmable Gate Arrays in a configuration similar to that of the Mirror Langmuir Probe, it is possible to bias a single probe at three precise voltages in sequence. These voltages can be dynamically adjusted in real-time based on the measured plasma electron temperature to ensure the transition region is always sampled. The first results have been obtained by employing this method and have generated real-time outputs of electron temperature, ion saturation current, and floating potential on a low temperature pulsed-DC magnetron at 500 kHz. These results are in good agreement with the analysis of a conventionally swept Langmuir probe. This probe is designed with the intention of being implemented on MAST-U to aid in the study of exhaust physics and enable further investigation into filamentary behavior. [Abstract copyright: © 2024 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).]

Citation

Hickling, C. J., Hall, S., Harrison, J. R., Sharples, R., & Bradley, J. W. (2024). A field programmable gate array based Langmuir probe system for measurement of plasma parameters at 500 kHz in a high-power impulse magnetron sputtering plasma. Review of Scientific Instruments, 95(3), Article 033503. https://doi.org/10.1063/5.0174458

Journal Article Type Article
Acceptance Date Feb 12, 2024
Online Publication Date Mar 18, 2024
Publication Date Mar 1, 2024
Deposit Date May 14, 2024
Publicly Available Date May 15, 2024
Journal Review of Scientific Instruments
Print ISSN 0034-6748
Publisher American Institute of Physics
Peer Reviewed Peer Reviewed
Volume 95
Issue 3
Article Number 033503
DOI https://doi.org/10.1063/5.0174458
Public URL https://durham-repository.worktribe.com/output/2378882

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