W. Palosz
The effect of the wall contact and post-growth cool-down on defects in CdTe crystals grown by 'contactless' physical vapour transport
Palosz, W.; Grasza, K.; Durose, K.; Halliday, D.P.; Boyall, N.M.; Dudley, M.; Raghothamachar, B.; Cai, L.
Authors
K. Grasza
K. Durose
Professor Douglas Halliday d.p.halliday@durham.ac.uk
Professor
N.M. Boyall
M. Dudley
B. Raghothamachar
L. Cai
Abstract
A series of cadmium telluride crystals grown by physical vapour transport without contact with the ampoule walls and cooled at different rates were characterized using synchrotron X-ray topography, photoluminescence, and chemical etching. Strain from sticking to silica glass and its effect on the dislocation density is shown. It was found that very fast cool-down (e.g. air or water quenching) increases dislocation density by at least one order of magnitude. None of the samples had random dislocation distributions, but coarse clumping of dislocations on the scale of more than 100 μm was more prevalent in slowly cooled crystals. Photoluminescence revealed that slow cooling (e.g. 10°C/h) favoured the donor–acceptor luminescence involving complex A centres. This was diminished in fast-cooled material, an effect presumed to be due to dislocation gettering. Fast cooling also enhanced the formation of shallow acceptors. Implications for Bridgman growth of CdTe and the vapour growth of CdZnTe are discussed briefly.
Citation
Palosz, W., Grasza, K., Durose, K., Halliday, D., Boyall, N., Dudley, M., …Cai, L. (2003). The effect of the wall contact and post-growth cool-down on defects in CdTe crystals grown by 'contactless' physical vapour transport. Journal of Crystal Growth, 254(3-4), 316-328. https://doi.org/10.1016/s0022-0248%2803%2901183-7
Journal Article Type | Article |
---|---|
Publication Date | 2003-07 |
Deposit Date | Dec 15, 2006 |
Journal | Journal of Crystal Growth |
Print ISSN | 0022-0248 |
Publisher | Elsevier |
Peer Reviewed | Peer Reviewed |
Volume | 254 |
Issue | 3-4 |
Pages | 316-328 |
DOI | https://doi.org/10.1016/s0022-0248%2803%2901183-7 |
Keywords | Cool-down, Defects, Dislocation distribution, Synchrotron white beam x-ray topography. |
Public URL | https://durham-repository.worktribe.com/output/1605477 |
You might also like
In situ oxygen incorporation and related issues in CdTe/CdS photovoltaic devices
(2006)
Journal Article
Downloadable Citations
About Durham Research Online (DRO)
Administrator e-mail: dro.admin@durham.ac.uk
This application uses the following open-source libraries:
SheetJS Community Edition
Apache License Version 2.0 (http://www.apache.org/licenses/)
PDF.js
Apache License Version 2.0 (http://www.apache.org/licenses/)
Font Awesome
SIL OFL 1.1 (http://scripts.sil.org/OFL)
MIT License (http://opensource.org/licenses/mit-license.html)
CC BY 3.0 ( http://creativecommons.org/licenses/by/3.0/)
Powered by Worktribe © 2024
Advanced Search