R.I. Port
Depth Resolved X-ray Studies Of Tilt Distributions In Cdte/gaas Epilayers
Port, R.I.; Moore, C.D.; Tanner, B.K.; Durose, K.; Hails, J.E.
Authors
Citation
Port, R., Moore, C., Tanner, B., Durose, K., & Hails, J. (1995). Depth Resolved X-ray Studies Of Tilt Distributions In Cdte/gaas Epilayers. Institute of physics conference series, 146, 309-312
| Journal Article Type | Article |
|---|---|
| Publication Date | 1995 |
| Journal | Institute of physics conference series. |
| Print ISSN | 0951-3248 |
| Electronic ISSN | 2154-6630 |
| Publisher | IOP Publishing |
| Volume | 146 |
| Pages | 309-312 |
| Public URL | https://durham-repository.worktribe.com/output/1605442 |
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