Diode laser wavelength tracking using an integrated dual slab waveguide interferometer

Cross, G.H.; Strachan, E.E.

Abstract

The problem of tracking small changes in the output wavelength of laser diodes is addressed using a dual slab waveguide interferometer fabricated from silicon oxynitride. Waveguide mode dispersion differences between the waveguide modes provide a mechanism for identifying input wavelength shifts that are measured as shifts in the output far-field diffraction image. At visible wavelengths the device can transduce input wavelength changes into phase responses with a sensitivity of +0.9 rad/nm. The lower threshold limit of detection for laser output frequency shifts, is 2.2 GHz or 6 pm at a center wavelength of 635 run. The TE and TM sensitivities to wavelength are approximately equivalent in the device described.

Citation

Cross, G., & Strachan, E. (2002). Diode laser wavelength tracking using an integrated dual slab waveguide interferometer. IEEE Photonics Technology Letters, 14(7), 950-952. https://doi.org/10.1109/lpt.2002.1012395

• Journal Article Type: Article
• Publication Date: 2002-07
• Deposit Date: May 28, 2008
• Publicly Available Date: May 28, 2008
• Journal: IEEE Photonics Technology Letters
• Print ISSN: 1041-1135
• Electronic ISSN: 1941-0174
• Publisher: Institute of Electrical and Electronics Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 14
• Issue: 7
• Pages: 950-952
• DOI: https://doi.org/10.1109/lpt.2002.1012395
• Keywords: Dispersion, Interferometer, Optical waveguides, Wavelength lockers.
• Public URL: https://durham-repository.worktribe.com/output/1580427