M Palumbo
Atomic force microscope characterization of poly(ethyleneimine)/poly(ethylene-co-maleic acid) and poly(ethyleneimine)/poly(styrene sulfonate) multilayers
Palumbo, M; Pearson, C; Petty, MC
Citation
Palumbo, M., Pearson, C., & Petty, M. (2005). Atomic force microscope characterization of poly(ethyleneimine)/poly(ethylene-co-maleic acid) and poly(ethyleneimine)/poly(styrene sulfonate) multilayers. Thin Solid Films, 483(1-2), 114-121
| Journal Article Type | Article |
|---|---|
| Publication Date | 2005-07 |
| Journal | Thin Solid Films |
| Print ISSN | 0040-6090 |
| Electronic ISSN | 1879-2731 |
| Publisher | Elsevier |
| Peer Reviewed | Peer Reviewed |
| Volume | 483 |
| Issue | 1-2 |
| Pages | 114-121 |
| Keywords | layer-by-layer films; atomic force microscopy (AFM)FLEXIBLE POLYELECTROLYTE MOLECULES; THIN-FILMS; ALTERNATING ADSORPTION;CHARGED SURFACES; BUILDUP; GLOBULE; GROWTH; LAYERS; AFM |
| Public URL | https://durham-repository.worktribe.com/output/1553991 |
You might also like
Towards Intelligently Designed Evolvable Processors
(2022)
Journal Article
Electrical behaviour and evolutionary computation in thin films of bovine brain microtubules
(2021)
Journal Article
Organic electronic memory devices
(2019)
Book Chapter
Downloadable Citations
About Durham Research Online (DRO)
Administrator e-mail: dro.admin@durham.ac.uk
This application uses the following open-source libraries:
SheetJS Community Edition
Apache License Version 2.0 (http://www.apache.org/licenses/)
PDF.js
Apache License Version 2.0 (http://www.apache.org/licenses/)
Font Awesome
SIL OFL 1.1 (http://scripts.sil.org/OFL)
MIT License (http://opensource.org/licenses/mit-license.html)
CC BY 3.0 ( http://creativecommons.org/licenses/by/3.0/)
Powered by Worktribe © 2025
Advanced Search