WJ Lin
Synchrotron X-ray studies of ultra-high-quality crystalline YBa2Cu3O7-delta in submicron thick films
Lin, WJ; Hatton, PD; Baudenbacher, F; Santiso, J
Citation
Lin, W., Hatton, P., Baudenbacher, F., & Santiso, J. (1999). Synchrotron X-ray studies of ultra-high-quality crystalline YBa2Cu3O7-delta in submicron thick films. IEEE Transactions on Applied Superconductivity, 9(2), 1852-1855
| Journal Article Type | Article |
|---|---|
| Publication Date | 1999-06 |
| Deposit Date | Sep 10, 2010 |
| Journal | IEEE Transactions on Applied Superconductivity |
| Print ISSN | 1051-8223 |
| Electronic ISSN | 1558-2515 |
| Publisher | Institute of Electrical and Electronics Engineers |
| Volume | 9 |
| Issue | 2 |
| Pages | 1852-1855 |
| Keywords | 2-CIRCLE POWDER DIFFRACTOMETER; CRITICAL CURRENT-DENSITY; INTERFACE STRUCTURE; EPITAXIAL-FILMS; SCATTERING; STRAIN; DIFFRACTION; MORPHOLOGY; TEMPERATURE; RELAXATION |
| Public URL | https://durham-repository.worktribe.com/output/1549337 |
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