Spectroscopic detection of atom-surface interactions in an atomic-vapor layer with nanoscale thickness

Whittaker, K.A.; Keaveney, J.; Hughes, I.G.; Sargsyan, A.; Sarkisyan, D.; Adams, C.S.

Abstract

We measure the resonance line shape of atomic-vapor layers with nanoscale thickness confined between two sapphire windows. The measurement is performed by scanning a probe laser through resonance and collecting the scattered light. The line shape is dominated by the effects of Dicke narrowing, self-broadening, and atom-surface interactions. By fitting the measured line shape to a simple model we discuss the possibility to extract information about the atom-surface interaction.

Citation

Whittaker, K., Keaveney, J., Hughes, I., Sargsyan, A., Sarkisyan, D., & Adams, C. (2015). Spectroscopic detection of atom-surface interactions in an atomic-vapor layer with nanoscale thickness. Physical Review A, 92(5), Article 052706. https://doi.org/10.1103/physreva.92.052706

• Journal Article Type: Article
• Publication Date: Nov 9, 2015
• Deposit Date: Jan 11, 2016
• Publicly Available Date: Jan 25, 2016
• Journal: Physical Review A - Atomic, Molecular, and Optical Physics
• Print ISSN: 1050-2947
• Electronic ISSN: 1094-1622
• Publisher: American Physical Society
• Peer Reviewed: Peer Reviewed
• Volume: 92
• Issue: 5
• Article Number: 052706
• DOI: https://doi.org/10.1103/physreva.92.052706
• Public URL: https://durham-repository.worktribe.com/output/1394939