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A compact, smart Langmuir Probe control module for MAST-Upgrade

Lovell, J.; Stephen, R.; Bray, S.; Naylor, G.; Elmore, S.; Willett, H.; Peterka, M.; Dimitrova, M.; Havranek, A.; Hron, M.; Sharples, R.

A compact, smart Langmuir Probe control module for MAST-Upgrade Thumbnail


Authors

J. Lovell

R. Stephen

S. Bray

G. Naylor

S. Elmore

H. Willett

M. Peterka

M. Dimitrova

A. Havranek

M. Hron



Abstract

A new control module for the MAST-Upgrade Langmuir Probe system has been developed. It is based on a Xilinx Zynq FPGA, which allows for excellent configurability and ease of retrieving data. The module is capable of arbitrary bias voltage waveform generation, and digitises current and voltage readings from 16 probes. The probes are biased and measured one at a time in a time multiplexed fashion, with the multiplexing sequence completely configurable. In addition, simultaneous digitisation of the floating potential of all unbiased probes is possible. A suite of these modules, each coupled with a high voltage amplifier, enables biasing and digitisation of 640 Langmuir Probes in the MAST-Upgrade Super-X divertor. The system has been successfully tested on the York Linear Plasma Device and on the COMPASS tokamak. It will be installed on MAST-Upgrade ready for operations in 2018.

Citation

Lovell, J., Stephen, R., Bray, S., Naylor, G., Elmore, S., Willett, H., …Sharples, R. (2017). A compact, smart Langmuir Probe control module for MAST-Upgrade. Journal of Instrumentation, 12(11), Article C11008. https://doi.org/10.1088/1748-0221/12/11/c11008

Journal Article Type Article
Acceptance Date Oct 22, 2017
Online Publication Date Nov 7, 2017
Publication Date Nov 7, 2017
Deposit Date Nov 24, 2017
Publicly Available Date Nov 7, 2018
Journal Journal of Instrumentation
Publisher IOP Publishing
Peer Reviewed Peer Reviewed
Volume 12
Issue 11
Article Number C11008
DOI https://doi.org/10.1088/1748-0221/12/11/c11008
Public URL https://durham-repository.worktribe.com/output/1370540

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Copyright Statement
This is an author-created, un-copyedited version of an article accepted for publication/published in Journal of Instrumentation. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.1088/1748-0221/12/11/C11008






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