Ms Clare Higgins clare.r.higgins@durham.ac.uk
Post Doctoral Research Associate
Atomic line vs. lens cavity filters: A comparison of their merits
Higgins, Clare R; Pizzey, Danielle; Mathew, Renju S; Hughes, Ifan G
Authors
Dr Danielle Pizzey danielle.boddy@durham.ac.uk
Post Doctoral Research Associate
Renju S Mathew
Professor Ifan Hughes i.g.hughes@durham.ac.uk
Professor
Abstract
We present a comparison between lens cavity filters and atomic line filters, discussing their relative merits for applications in quantum optics. We describe the design, characterization, and stabilization procedure of a lens cavity filter, which consists of a high-reflection coated commercially available plano-convex lens, and compare it to an ultra-narrow atomic band-pass filter utilizing the D2 absorption line in atomic rubidium vapor. We find that the cavity filter peak transmission frequency and bandwidth can be chosen arbitrarily but the transmission frequency is subject to thermal drift and the cavity needs stabilization to better than a few mK, while the atomic filter is intrinsically stable and tied to an atomic resonance frequency such that it can be used in a non-laboratory environment.
Citation
Higgins, C. R., Pizzey, D., Mathew, R. S., & Hughes, I. G. (2020). Atomic line vs. lens cavity filters: A comparison of their merits. OSA continuum, 3(4), 961-970. https://doi.org/10.1364/osac.390604
Journal Article Type | Article |
---|---|
Acceptance Date | Mar 27, 2020 |
Online Publication Date | Apr 7, 2020 |
Publication Date | Apr 15, 2020 |
Deposit Date | Feb 14, 2020 |
Publicly Available Date | Apr 21, 2020 |
Journal | OSA continuum. |
Publisher | Optica Publishing Group |
Peer Reviewed | Peer Reviewed |
Volume | 3 |
Issue | 4 |
Pages | 961-970 |
DOI | https://doi.org/10.1364/osac.390604 |
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Copyright Statement
Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.
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