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Selectivity in Electron Attachment to Water Clusters

Lietard, Aude; Verlet, Jan R.R.

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Authors

Aude Lietard



Abstract

Electron attachment onto water clusters to form water cluster anions is studied by varying the point of electron attachment along a molecular beam axis and probing the produced cluster anions using photoelectron spectroscopy. The results show that the point of electron attachment has a clear effect on the final distribution of isomers for a cluster containing 78 water molecules, with isomer I formed preferentially near the start of the expansion and isomer II formed preferentially once the molecular beam has progressed for several millimetres. These changes can be accounted for by the cluster growth rate along the beam. Near the start of the expansion, cluster growth is proceeding rapidly with condensing water molecules solvating the electron, while further along the expansion, the growth has terminated and electrons are attached to large and cold preformed clusters, leading to the isomer associated with a loosely bound surface state.

Citation

Lietard, A., & Verlet, J. R. (2019). Selectivity in Electron Attachment to Water Clusters. Journal of Physical Chemistry Letters, 10(6), 1180-1184. https://doi.org/10.1021/acs.jpclett.9b00275

Journal Article Type Article
Acceptance Date Feb 28, 2019
Online Publication Date Feb 28, 2019
Publication Date Feb 28, 2019
Deposit Date Mar 1, 2019
Publicly Available Date Feb 28, 2020
Journal Journal of Physical Chemistry Letters
Electronic ISSN 1948-7185
Publisher American Chemical Society
Peer Reviewed Peer Reviewed
Volume 10
Issue 6
Pages 1180-1184
DOI https://doi.org/10.1021/acs.jpclett.9b00275
Public URL https://durham-repository.worktribe.com/output/1301986

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Copyright Statement
This document is the Accepted Manuscript version of a Published Work that appeared in final form in Journal of physical chemistry letters copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://doi.org/10.1021/acs.jpclett.9b00275





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