Outputs (11)

Thermal-degradation Of Sige Interfaces Studied By X-ray Reflectivity And Diffraction (1992)
Journal Article
Hudson, J., Powell, A., Bowen, D., Wormington, M., Tanner, B., Kubiak, R., & Parker, E. (1992). Thermal-degradation Of Sige Interfaces Studied By X-ray Reflectivity And Diffraction