Robert Grosseteste: A medieval thinker with a legacy for modern science.
(2021)
Journal Article
Tanner, B. K. (2021). Robert Grosseteste: A medieval thinker with a legacy for modern science. Istituto Lombardo - Accademia di Scienze e Lettere - Rendiconti di Scienze, 155, https://doi.org/10.4081/scienze.2021.767
Outputs (4)
‘Travelling Optics: Robert Grosseteste and the Optics behind the Rainbow’ (2021)
Book Chapter
Gasper, G. E., Tanner, B. K., Sønnesyn, S. O., & El-Bizri, N. (2021). ‘Travelling Optics: Robert Grosseteste and the Optics behind the Rainbow’. In C. Etheridge, & M. Campopiano (Eds.), Medieval Science in the North: Travelling Wisdom, 1000-1500 (45-75). Brepols Publishers
Magnifying Grains of Sand, Seeds, and Blades of Grass: Optical Effects in Robert Grosseteste’s De iride (On the Rainbow) (circa 1228–1230) (2021)
Journal Article
White, R. C., Gasper, G. E., McLeish, T. C., Tanner, B. K., Harvey, J. S., Sønnesyn, S. O., Young, L. K., & Smithson, H. E. (2021). Magnifying Grains of Sand, Seeds, and Blades of Grass: Optical Effects in Robert Grosseteste’s De iride (On the Rainbow) (circa 1228–1230). Isis: A Journal of the History of Science Society, 112(1), 93-107. https://doi.org/10.1086/713724In his treatise On the Rainbow (De iride), composed nearly four hundred years before the first known telescope, the English polymath Robert Grosseteste identified three striking optical effects: distant objects can be rendered close by; close-by larg... Read More about Magnifying Grains of Sand, Seeds, and Blades of Grass: Optical Effects in Robert Grosseteste’s De iride (On the Rainbow) (circa 1228–1230).
X-ray imaging of silicon die within fully packaged semiconductor devices (2021)
Journal Article
Tanner, B. K., McNally, P. J., & Danilewsky, A. N. (2021). X-ray imaging of silicon die within fully packaged semiconductor devices. Powder Diffraction, 36(2), 78-84. https://doi.org/10.1017/s088571562100021xX-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been shown that the tilt of the lattice planes in the Anal... Read More about X-ray imaging of silicon die within fully packaged semiconductor devices.