Grazing Incidence X-Ray Reflectivity and Scattering
(2018)
Book Chapter
Tanner, B. K. (2018). Grazing Incidence X-Ray Reflectivity and Scattering. In N. Ida, & N. Meyendorf (Eds.), Handbook of Advanced Non-Destructive Evaluation (1-16). Springer Verlag. https://doi.org/10.1007/978-3-319-30050-4_16-1
Outputs (4)
Spin-out, licence or collaborate: The Knowledge Transfer Dilemma (2018)
Other
Tanner, B. (2018). Spin-out, licence or collaborate: The Knowledge Transfer Dilemma
In-situ synchrotron X-ray topography observation of double-ended Frank-Read sources in PVT-grown 4H-SiC wafers (2018)
Presentation / Conference Contribution
Yang, Y., Guo, J., Raghothamachar, B., Dudley, M., Welt, S., Danilewsky, A., McNally, P., & Tanner, B. (2018, December). In-situ synchrotron X-ray topography observation of double-ended Frank-Read sources in PVT-grown 4H-SiC wafers. Presented at 2017 International Conference on Silicon Carbide and Related Materials, Washington DC
Direct observation of stress relaxation process in 4H-SiC homoepitaxial layers via in-situ synchrotron X-ray topography (2018)
Presentation / Conference Contribution
Guo, J., Yang, Y., Raghothamachar, B., Dudley, M., Welt, S., Danilewsky, A., McNally, P., & Tanner, B. (2018, December). Direct observation of stress relaxation process in 4H-SiC homoepitaxial layers via in-situ synchrotron X-ray topography. Presented at 2017 International Conference on Silicon Carbide and Related Materials, Washington DC