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Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole and fluorene units (2013)
Journal Article
Pearson, C., Bowen, L., Lee, M., Fisher, A., Linton, K., Bryce, M., & Petty, M. (2013). Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole and fluorene units. Applied Physics Letters, 102(21), https://doi.org/10.1063/1.4808026

We report on the mechanism of operation of organic thin film resistive memory architectures based on an ambipolar compound consisting of oxadiazole, carbazole, and fluorene units. Cross-sections of the devices have been imaged by electron microscopy... Read More about Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole and fluorene units.