Scanning thermal microscopy with heat conductive nanowire probes
(2015)
Journal Article
Timofeev, M., Bolshakov, A., Tovee, P., Zeze, D., Dubrovskii, V., & Kolosov, O. (2016). Scanning thermal microscopy with heat conductive nanowire probes. Ultramicroscopy, 162, 42-51. https://doi.org/10.1016/j.ultramic.2015.12.006
Scanning thermal microscopy (SThM), which enables measurement of thermal transport and temperature distribution in devices and materials with nanoscale resolution is rapidly becoming a key approach in resolving heat dissipation problems in modern pro... Read More about Scanning thermal microscopy with heat conductive nanowire probes.