Outputs (2)

The distribution of impurities in the interfaces and window layers of thin-film solar cells (2005)
Journal Article
Emziane, M., Durose, K., Halliday, D., Romeo, N., & Bosio, A. (2005). The distribution of impurities in the interfaces and window layers of thin-film solar cells. Journal of Applied Physics, 97(11), Article 114910. https://doi.org/10.1063/1.1921344

We report a systematic multielement study of impurities in CdS window layers by dynamic and quantitative secondary-ion-mass spectrometry (SIMS) with high depth resolution. The study was carried out on CdTe/CdS solar cell structures, with the glass su... Read More about The distribution of impurities in the interfaces and window layers of thin-film solar cells.

A combined SIMS and ICPMS investigation of the origin and distribution of potentially electrically active impurities in CdTe/CdS solar cell structures (2005)
Journal Article
Emziane, M., Durose, K., Romeo, N., Bosio, A., & Halliday, D. (2005). A combined SIMS and ICPMS investigation of the origin and distribution of potentially electrically active impurities in CdTe/CdS solar cell structures. Semiconductor Science and Technology, 20(5), 434-442. https://doi.org/10.1088/0268-1242/20/5/019

Quantitative, dynamic secondary ion mass spectrometry (SIMS) combined with inductively coupled plasma mass spectrometry (ICPMS) was used to study the origin and distribution of impurities in CdTe/CdS/In2O3:F/glass solar cell structures. Particular em... Read More about A combined SIMS and ICPMS investigation of the origin and distribution of potentially electrically active impurities in CdTe/CdS solar cell structures.