Outputs (3)

On the origin of impurities in the window layers of CdTe/CdS solar cells (2006)
Book Chapter
Emziane, M., Durose, K., & Halliday, D. (2006). On the origin of impurities in the window layers of CdTe/CdS solar cells. In R. Kassing, P. Petkov, W. Kulisch, & C. Popov (Eds.), Functional Properties of Nanostructured Materials (257-260). Springer Verlag

In situ oxygen incorporation and related issues in CdTe/CdS photovoltaic devices (2006)
Journal Article
Emziane, M., Durose, K., Halliday, D., Bosio, A., & Romeo, N. (2006). In situ oxygen incorporation and related issues in CdTe/CdS photovoltaic devices. Journal of Applied Physics, 100(1), https://doi.org/10.1063/1.2209788

CdTe/CdS/SnO2/ITO:F solar cell devices were investigated using quantitative secondary ion mass spectrometry (SIMS) depth profiling. They were grown on sapphire substrates and potentially active impurity species were analyzed. The SIMS data were calib... Read More about In situ oxygen incorporation and related issues in CdTe/CdS photovoltaic devices.

SIMS depth profiling of CdTe-based solar cells grown on sapphire substrates. (2006)
Journal Article
Emziane, M., Durose, K., Halliday, D., Romeo, N., & Bosio, A. (2006). SIMS depth profiling of CdTe-based solar cells grown on sapphire substrates. Thin Solid Films, 511-512, 66-70. https://doi.org/10.1016/j.tsf.2005.11.094

CdTe/CdS/TCO solar cell structures were grown on sapphire substrates especially to investigate the impurity distributions in them. The study was performed using quantitative secondary ion mass spectrometry (SIMS) depth profiling, from the CdTe back s... Read More about SIMS depth profiling of CdTe-based solar cells grown on sapphire substrates..