Skip to main content

Research Repository

Advanced Search

Outputs (1599)

Compression Moulding (1999)
Patent
Wu, J., Buckley, C., & O'Connor, J. (1999). Compression Moulding

Air-Gapped Current Transformer simulation and accuracy assessment (2022)
Presentation / Conference Contribution
Ceron-Oliver, L., Wang, Q., & Zeze, D. (2022). Air-Gapped Current Transformer simulation and accuracy assessment. . https://doi.org/10.1109/melecon53508.2022.9843105

The implementation of smart grids makes it necessary to have reliable and efficient measuring devices. Current sensors used for metering purposes in the grid must be accurate enough to overcome new challenges that power networks face such as injectio... Read More about Air-Gapped Current Transformer simulation and accuracy assessment.

Enhanced Methods for Evolution in-Materio Processors (2022)
Presentation / Conference Contribution
Jones, B. A., Al Moubayed, N., Zeze, D. A., & Groves, C. (2022). Enhanced Methods for Evolution in-Materio Processors. . https://doi.org/10.1109/icrc53822.2021.00026

Evolution-in-Materio (EiM) is an unconventional computing paradigm, which uses an Evolutionary Algorithm (EA) to configure a material's parameters so that it can perform a computational task. While EiM processors show promise, slow manufacturing and... Read More about Enhanced Methods for Evolution in-Materio Processors.

In-situ synchrotron X-ray topography observation of double-ended Frank-Read sources in PVT-grown 4H-SiC wafers (2018)
Presentation / Conference Contribution
Yang, Y., Guo, J., Raghothamachar, B., Dudley, M., Welt, S., Danilewsky, A., …Tanner, B. (2018). In-situ synchrotron X-ray topography observation of double-ended Frank-Read sources in PVT-grown 4H-SiC wafers. In R. Stahlbush, P. Neudeck, A. Bhalla, R. Devaty, M. Dudley, & A. Lelis (Eds.), Silicon Carbide and Related Materials 2017 (172-175). https://doi.org/10.4028/www.scientific.net/msf.924

Confidence Measures for Carbon-Nanotube / Liquid Crystals Classifiers (2018)
Presentation / Conference Contribution
Vissol-Gaudin, E., Kotsialos, A., Groves, C., Pearson, C., Zeze, D., Petty, M., & Al-moubayed, N. (2018). Confidence Measures for Carbon-Nanotube / Liquid Crystals Classifiers. In 2018 IEEE Congress on Evolutionary Computation (CEC) : 8-13 July 2018, Rio de Janeiro, Brazil ; proceedings (646-653). https://doi.org/10.1109/cec.2018.8477779

This paper focuses on a performance analysis of single-walled-carbon-nanotube / liquid crystal classifiers produced by evolution in materio. A new confidence measure is proposed in this paper. It is different from statistical tools commonly used to e... Read More about Confidence Measures for Carbon-Nanotube / Liquid Crystals Classifiers.

Direct observation of stress relaxation process in 4H-SiC homoepitaxial layers via in-situ synchrotron X-ray topography (2018)
Presentation / Conference Contribution
Guo, J., Yang, Y., Raghothamachar, B., Dudley, M., Welt, S., Danilewsky, A., …Tanner, B. (2018). Direct observation of stress relaxation process in 4H-SiC homoepitaxial layers via in-situ synchrotron X-ray topography. In R. Stahlbush, P. Neudeck, A. Bhalla, R. Devaty, M. Dudley, & A. Lelis (Eds.), Silicon Carbide and Related Materials 2017 (176-179). https://doi.org/10.4028/www.scientific.net/msf.924

Artificial Dielectric Based Antireflection layer for Terahertz Applications (2016)
Presentation / Conference Contribution
Hajji, M., Zeze, D., Balocco, C., & Gallant, A. (2016, June). Artificial Dielectric Based Antireflection layer for Terahertz Applications. Paper presented at Nanostructures for Photonics (NSP) 2016, St Petersburg, Russia

We report on experimental and simulation results for low-loss micromachined silicon artificial dielectrics operating as antireflection coating at terahertz frequencies. The artificial layers consist of subwavelength microgrooves with different profil... Read More about Artificial Dielectric Based Antireflection layer for Terahertz Applications.