Outputs (4)

Scattering of spoof surface plasmon polaritons in defect-rich THz waveguides (2019)
Journal Article
Klein, A. K., Basden, A., Hammler, J., Tyas, L., Cooke, M., Balocco, C., …Gallant, A. (2019). Scattering of spoof surface plasmon polaritons in defect-rich THz waveguides. Scientific Reports, 9(1), Article 6288. https://doi.org/10.1038/s41598-019-42412-6

We report on the first observation of ‘Spoof’ Surface Plasmon Polariton (SPP) scattering from surface defects on metal-coated 3D printed, corrugated THz waveguiding surfaces. Surface defects, a result of the printing process, are shown to assist the... Read More about Scattering of spoof surface plasmon polaritons in defect-rich THz waveguides.

Machinable ceramic for high performance and compact THz optical components (2018)
Journal Article
Klein, A. K., Hammler, J., Balocco, C., & Gallant, A. J. (2018). Machinable ceramic for high performance and compact THz optical components. Optical Materials Express, 8(7), 1968-1975. https://doi.org/10.1364/ome.8.001968

The properties of Shapal Hi-M Soft, an aluminum nitride based ceramic, as a material for THz optical components are investigated and compared with other ceramic materials. Shapal is a low-cost and machinable ceramic with a high-refractive index and l... Read More about Machinable ceramic for high performance and compact THz optical components.

Field imaging near to the surface of terahertz reflective optics using a vector network analyzer (2017)
Journal Article
Hajji, M., Hammler, J., Zeze, D., Balocco, C., & Gallant, A. J. (2017). Field imaging near to the surface of terahertz reflective optics using a vector network analyzer. Applied Optics, 56(31), 8746-8750. https://doi.org/10.1364/ao.56.008746

A vector network analyzer-based quasi-optical measurement system that is suitable for mapping electric field intensity and phase near to the surface of terahertz reflective optics is presented. The system uses a fixed five parabolic mirror and transm... Read More about Field imaging near to the surface of terahertz reflective optics using a vector network analyzer.

Free-Space Permittivity Measurement at Terahertz Frequencies with a Vector Network Analyser (2016)
Journal Article
Hammler, J., Gallant, A. J., & Balocco, C. (2016). Free-Space Permittivity Measurement at Terahertz Frequencies with a Vector Network Analyser. IEEE Transactions on Terahertz Science & Technology, 6(6), 817-823. https://doi.org/10.1109/tthz.2016.2609204

A simple system, based on a vector network analyzer, has been used with new numerical de-embedding and parameter inversion techniques to determine the relative permittivity (dielectric properties) of materials within the frequency range 750–1100 GHz.... Read More about Free-Space Permittivity Measurement at Terahertz Frequencies with a Vector Network Analyser.