Brian Tanner's Outputs (4)

X-ray Topographic Studies Of Dislocation Contrast In Silicon After Boron Diffusion (1973)
Journal Article
Tanner, B. (1973). X-ray Topographic Studies Of Dislocation Contrast In Silicon After Boron Diffusion. Journal of Applied Crystallography, 6, 31-38

Dislocation-free Silver Single-crystals Grown By Czochralski Method (1973)
Journal Article
Tanner, B. (1973). Dislocation-free Silver Single-crystals Grown By Czochralski Method. Zeitschrift fur Naturforschung A: A Journal of Physical Sciences, A 28, 676-

Line Defects In Barium-titanate Observed By Polarized-light Microscopy (1973)
Journal Article
Fathers, D., & Tanner, B. (1973). Line Defects In Barium-titanate Observed By Polarized-light Microscopy. Philosophical magazine, 28, 749-770

Optical Contrast Of Inclined Boundaries In Birefringent Magnetic Materials (1973)
Journal Article
Fathers, D., & Tanner, B. (1973). Optical Contrast Of Inclined Boundaries In Birefringent Magnetic Materials. Philosophical magazine, 27, 17-34