RE Jones
Hot hole creation due to impact excitation in the metal electrode of a forward biased MIS structure.
Jones, RE; Abram, RA
Citation
Jones, R., & Abram, R. (1988). Hot hole creation due to impact excitation in the metal electrode of a forward biased MIS structure. Solid-State Electronics, 31, 989-997
| Journal Article Type | Article |
|---|---|
| Publication Date | 1988 |
| Journal | Solid-State Electronics |
| Print ISSN | 0038-1101 |
| Electronic ISSN | 1879-2405 |
| Publisher | Elsevier |
| Volume | 31 |
| Pages | 989-997 |
| Public URL | https://durham-repository.worktribe.com/output/1605159 |
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