High-Resolution Parallel-Beam Powder Diffraction Measurement of Sub-Surface Damage in Alumina-silicon carbide nanocomposite
(2006)
Journal Article
Tanner, B., Wu, H., & Roberts, S. (2006). High-Resolution Parallel-Beam Powder Diffraction Measurement of Sub-Surface Damage in Alumina-silicon carbide nanocomposite. Advances in x-ray analysis, 49, 169-174
The sub-surface damage in ground and subsequently annealed alumina/silicon carbide nanocomposite has been studied by analysis of the x-ray diffraction line width as a function of incidence angle. Bragg peak broadening fell as the depth of penetration... Read More about High-Resolution Parallel-Beam Powder Diffraction Measurement of Sub-Surface Damage in Alumina-silicon carbide nanocomposite.