Averaging the intensity of many-layered structures for accurate stacking-fault analysis using Rietveld refinement
(2016)
Journal Article
Coelho, A., Evans, J., & Lewis, J. (2016). Averaging the intensity of many-layered structures for accurate stacking-fault analysis using Rietveld refinement. Journal of Applied Crystallography, 49(5), 1740-1749. https://doi.org/10.1107/s1600576716013066
Many technologically important synthetic and natural materials display stacking faults which lead to complex peak broadenings, asymmetries and shifts in their powder diffraction patterns. The patterns can be described using an enlarged unit cell (cal... Read More about Averaging the intensity of many-layered structures for accurate stacking-fault analysis using Rietveld refinement.