Measurement of aluminum concentration in epitaxial layers of Al<SUB>x</SUB>Ga<SUB>1 - x</SUB>As on GaAs by double axis x-ray diffractometry
(1991)
Journal Article
Tanner, B., Turnbull, A., Stanley, C., Kean, A., & McElhinney, M. (1991). Measurement of aluminum concentration in epitaxial layers of AlxGa1 - xAs on GaAs by double axis x-ray diffractometry. Applied Physics Letters, 59, 2272-2274
All Outputs (11)
High-resolution Double Crystal Diffractometry Of High-tc Superconducting Epitaxial Gd-ba-cu-o Films (1991)
Journal Article
Dai, D., Green, G., Tanner, B., Li, H., Yi, H., & Wang, R. (1991). High-resolution Double Crystal Diffractometry Of High-tc Superconducting Epitaxial Gd-ba-cu-o Films
Double Axis X-ray-diffractometry Analysis Of The Homoepitaxial Interface Between Substrate And Buffer Layer (1991)
Journal Article
Green, G., Tanner, B., & Kightley, P. (1991). Double Axis X-ray-diffractometry Analysis Of The Homoepitaxial Interface Between Substrate And Buffer Layer
Asymmetric Relaxation In Epitaxial Layers Of Iii-v Compounds (1991)
Journal Article
Turnbull, A., Green, G., Tanner, B., & Halliwell, M. (1991). Asymmetric Relaxation In Epitaxial Layers Of Iii-v Compounds
Principles And Performance Of A Pc-based Program For Simulation Of Double-axis X-ray Rocking Curves Of Thin Epitaxial-films (1991)
Journal Article
Bowen, D., Loxley, N., Tanner, B., Cooke, L., & Capano, M. (1991). Principles And Performance Of A Pc-based Program For Simulation Of Double-axis X-ray Rocking Curves Of Thin Epitaxial-films
Structural analysis of high-T<SUB>c</SUB> epitaxial GdBa₂Cu₃O<SUB>7-x</SUB> superconducting thin films (1991)
Journal Article
Dai, D., Green, G., Tanner, B., Cui, S., Mai, Z., Li, H., …Wang, R. (1991). Structural analysis of high-Tc epitaxial GdBa₂Cu₃O7-x superconducting thin films
Dislocation Images In X-ray Section Topographs Of Curved Crystals (1991)
Journal Article
Green, G., Loxley, N., & Tanner, B. (1991). Dislocation Images In X-ray Section Topographs Of Curved Crystals. Journal of Applied Crystallography, 24, 304-311
Misfit Dislocations At The Critical Thickness For Ingaas/gaas Strained Layers (1991)
Journal Article
Green, G., Tanner, B., Turnbull, A., Barnett, S., Emeny, M., & Whitehouse, C. (1991). Misfit Dislocations At The Critical Thickness For Ingaas/gaas Strained Layers
The Performance Of Channel Cut Collimators For Precision X-ray-diffraction Studies Of Epitaxial Layers (1991)
Journal Article
Loxley, N., Bowen, D., & Tanner, B. (1991). The Performance Of Channel Cut Collimators For Precision X-ray-diffraction Studies Of Epitaxial Layers
X-ray Reflectometry From Semiconductor Surfaces And Interfaces (1991)
Journal Article
Tanner, B., Miles, S., Bowen, D., Hart, L., & Loxley, N. (1991). X-ray Reflectometry From Semiconductor Surfaces And Interfaces
X-ray Topography Studies Of Oxygen Precipitates In Mcz Silicon (1991)
Journal Article
Holland, A., Green, G., Tanner, B., & Mai, Z. (1991). X-ray Topography Studies Of Oxygen Precipitates In Mcz Silicon