All Outputs (14)

Autoencoders Without Reconstruction for Textural Anomaly Detection (2021)
Presentation / Conference Contribution
Adey, P., Akcay, S., Bordewich, M., & Breckon, T. (2021, July). Autoencoders Without Reconstruction for Textural Anomaly Detection. Presented at 2021 International Joint Conference on Neural Networks (IJCNN), Shenzhen, China

Automatic anomaly detection in natural textures is a key component within quality control for a range of high-speed, high-yield manufacturing industries that rely on camera-based visual inspection techniques. Targeting anomaly detection through the u... Read More about Autoencoders Without Reconstruction for Textural Anomaly Detection.

In-situ synchrotron X-ray topography observation of double-ended Frank-Read sources in PVT-grown 4H-SiC wafers (2018)
Presentation / Conference Contribution
Yang, Y., Guo, J., Raghothamachar, B., Dudley, M., Welt, S., Danilewsky, A., McNally, P., & Tanner, B. (2018, December). In-situ synchrotron X-ray topography observation of double-ended Frank-Read sources in PVT-grown 4H-SiC wafers. Presented at 2017 International Conference on Silicon Carbide and Related Materials, Washington DC

Direct observation of stress relaxation process in 4H-SiC homoepitaxial layers via in-situ synchrotron X-ray topography (2018)
Presentation / Conference Contribution
Guo, J., Yang, Y., Raghothamachar, B., Dudley, M., Welt, S., Danilewsky, A., McNally, P., & Tanner, B. (2018, December). Direct observation of stress relaxation process in 4H-SiC homoepitaxial layers via in-situ synchrotron X-ray topography. Presented at 2017 International Conference on Silicon Carbide and Related Materials, Washington DC

Nondestructive, In Situ Mapping of Die Surface Displacements in Encapsulated IC Chip Packages Using X-Ray Diffraction Imaging Techniques (2017)
Presentation / Conference Contribution
Gorji, N., Tanner, B., Vijayaraghavan, R., Danilewsky, A., & McNally, P. (2017, December). Nondestructive, In Situ Mapping of Die Surface Displacements in Encapsulated IC Chip Packages Using X-Ray Diffraction Imaging Techniques. Presented at 2017 IEEE 67th Electronic Components and Technology Conference (ECTC)

An optical platform for the production, trapping, manipulation and visualization of ultra-low interfacial tension emulsion droplets (2013)
Presentation / Conference Contribution
Hargreaves, A. L., Kirby, A. K., Bain, C. D., Love, G. D., Bolognesi, G., Ces, O., Neil, M., & Ward, A. D. (2013, August). An optical platform for the production, trapping, manipulation and visualization of ultra-low interfacial tension emulsion droplets. Presented at Optical Trapping and Optical Micromanipulation X, San Diego, CA

We discuss the design, implementation and performance of a novel platform for the production and optical control of ultra-low interfacial tension droplets in the 1-10 micron regime. A custom-designed, integrated microfluidic system allows the product... Read More about An optical platform for the production, trapping, manipulation and visualization of ultra-low interfacial tension emulsion droplets.

Phase modulation with polymer-dispersed liquid crystals (2005)
Presentation / Conference Contribution
Hands, P., Kirby, A., & Love, G. (2005, December). Phase modulation with polymer-dispersed liquid crystals

Optical design of liquid crystal lenses: off-axis modelling (2005)
Presentation / Conference Contribution
Kirby, A., Hands, P., & Love, G. (2005, December). Optical design of liquid crystal lenses: off-axis modelling

Advances in modal liquid crystals (2003)
Presentation / Conference Contribution
Kirby, A. K., Love, G. D., Naumov, A. F., & Kotova, S. (2003, December). Advances in modal liquid crystals

Direct, Independent Measurement Of Twist And Tilt Mosaic As A Function Of Thickness In Epitaxial Gan (2002)
Presentation / Conference Contribution
Lafford, T., Parbrook, P., & Tanner, B. (2002, December). Direct, Independent Measurement Of Twist And Tilt Mosaic As A Function Of Thickness In Epitaxial Gan. Presented at International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany

CD-ROM for the identification of blue-green algae of the British Isles (1999)
Presentation / Conference Contribution
Whitton, B., Gemmell, J., & Robinson, P. (1999, December). CD-ROM for the identification of blue-green algae of the British Isles. Presented at Proceedings of the conference of the Marine Biological Association: Using marine biological information in the electronic age

Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers (1996)
Presentation / Conference Contribution
Cockerton, S., Cooke, M., Bowen, D., & Tanner, B. (1996, December). Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers. Presented at Symposium on Diagnostic Techniques for Semiconductor Materials Processing II, Boston

Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale (1994)
Presentation / Conference Contribution
Wormington, M., Sakurai, K., Bowen, D., & Tanner, B. (1994, December). Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale. Presented at Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy, Boston

New Algorithms For Rapid Full-wafer Mapping By High-resolution Double Axis X-ray-diffraction (1994)
Presentation / Conference Contribution
Loxley, N., Cockerton, S., Cooke, L., Gray, T., Tanner, B., & Bowen, D. (1994, December). New Algorithms For Rapid Full-wafer Mapping By High-resolution Double Axis X-ray-diffraction. Presented at Symposium on Diagnostic Techniques for Semiconductor Materials Processing, Boston

A Grazing-incidence X-ray Reflectometer For Rapid Nondestructive Characterization Of Thin-films And Interfaces (1992)
Presentation / Conference Contribution
Loxley, N., Monteiro, A., Cooke, M., Bowen, D., & Tanner, B. (1992, December). A Grazing-incidence X-ray Reflectometer For Rapid Nondestructive Characterization Of Thin-films And Interfaces. Presented at Symposium of Advanced III-V Compound Semiconductor Growth, Processing and Device., Boston