Perfection Of Flux Grown Crystals
(1974)
Journal Article
Tanner, B. (1974). Perfection Of Flux Grown Crystals. Journal of Crystal Growth, 24, 637-640
All Outputs (464)
Optical Contrast Of Inclined Boundaries In Birefringent Magnetic Materials (1973)
Journal Article
Fathers, D., & Tanner, B. (1973). Optical Contrast Of Inclined Boundaries In Birefringent Magnetic Materials. Philosophical magazine, 27, 17-34
Line Defects In Barium-titanate Observed By Polarized-light Microscopy (1973)
Journal Article
Fathers, D., & Tanner, B. (1973). Line Defects In Barium-titanate Observed By Polarized-light Microscopy. Philosophical magazine, 28, 749-770
X-ray Topographic Studies Of Dislocation Contrast In Silicon After Boron Diffusion (1973)
Journal Article
Tanner, B. (1973). X-ray Topographic Studies Of Dislocation Contrast In Silicon After Boron Diffusion. Journal of Applied Crystallography, 6, 31-38
Dislocation-free Silver Single-crystals Grown By Czochralski Method (1973)
Journal Article
Tanner, B. (1973). Dislocation-free Silver Single-crystals Grown By Czochralski Method. Zeitschrift fur Naturforschung A: A Journal of Physical Sciences, A 28, 676-
Nearly Perfect Single-crystals Of Layer Compounds Grown By Iodine Vapor-transport Techniques (1972)
Journal Article
Rimmingt.hp, B. A., & Tanner, B. (1972). Nearly Perfect Single-crystals Of Layer Compounds Grown By Iodine Vapor-transport Techniques. Journal of Crystal Growth, 15, 51-
Perfection Of Czochralski Grown Copper Single-crystals (1972)
Journal Article
Tanner, B. (1972). Perfection Of Czochralski Grown Copper Single-crystals. Journal of Crystal Growth, 16, 86-
X-ray And Optical Observations Of Natural Fluorite (1972)
Journal Article
Tanner, B. (1972). X-ray And Optical Observations Of Natural Fluorite. Physica status solidi. A, Applied research, 14, K9-
Dislocation Contrast In X-ray Topographs Of Very Thin Crystals (1972)
Journal Article
Tanner, B. (1972). Dislocation Contrast In X-ray Topographs Of Very Thin Crystals. Physica status solidi. A, Applied research, 10, 381-
Display Of X-ray Topographic Images Using A Channel Plate (1971)
Journal Article
Parpia, D., & Tanner, B. (1971). Display Of X-ray Topographic Images Using A Channel Plate. Physica status solidi. A, Applied research, 6, 689-
RESEARCH NOTES: High resolution divergent-beam X-ray topography (1970)
Journal Article
Tanner, B., & Humphreys, C. (1970). RESEARCH NOTES: High resolution divergent-beam X-ray topography. Journal of Physics D: Applied Physics, 3, 1144-1146
Principles And Performance Of A Multi-axis, Direct Drive X-ray Diffractometer For The Characterisation Of Advanced Materials
Journal Article
Loxley, N., Gray, T., Tanner, B., & Bowen, D. (online). Principles And Performance Of A Multi-axis, Direct Drive X-ray Diffractometer For The Characterisation Of Advanced Materials. AIP Conference Proceedings, 672-677
Studies On Pi-acceptor Molecules Containing The Dicyanomethylene Group - X-ray Crystal-structure Of The Charge-transfer Complex Of Tetramethyltetrathiafulvalene And 2,3-dicyano-1,4-naphthoquinone - (tmttf)3-(dcnq)2
Journal Article
Batsanov, A., Bryce, M., Davies, S., Howard, J., Whitehead, R., & Tanner, B. (online). Studies On Pi-acceptor Molecules Containing The Dicyanomethylene Group - X-ray Crystal-structure Of The Charge-transfer Complex Of Tetramethyltetrathiafulvalene And 2,3-dicyano-1,4-naphthoquinone - (tmttf)3-(dcnq)2. Journal of the Chemical Society. Perkin transactions II, 313-319
The Distribution Of Lattice Strain And Tilt In Lec Semi-insulating Gaas Measured By Double Crystal X-ray Topography
Journal Article
Barnett, S., Brown, G., & Tanner, B. (online). The Distribution Of Lattice Strain And Tilt In Lec Semi-insulating Gaas Measured By Double Crystal X-ray Topography. Institute of physics conference series, 615-620
Dislocation Bundles In Gaas Substrates: Assessed By X-ray And Makyoh Topography, X-ray Diffraction, Tem, Scanning Infrared Polariscopy, Light Interferometry, And Nomarski Microscopy
Journal Article
Mock, P., Fukuzawa, M., Laczik, Z., Smith, G., Booker, G., Yamada, M., Herms, M., & Tanner, B. (online). Dislocation Bundles In Gaas Substrates: Assessed By X-ray And Makyoh Topography, X-ray Diffraction, Tem, Scanning Infrared Polariscopy, Light Interferometry, And Nomarski Microscopy. Institute of physics conference series, 67-72
The First Solid-state Paramagnetic 1,2,3,5-dithiadiazolyl Radical - X-ray Crystal-structure Of [p-ncc6f4cnssn]center-dot
Journal Article
Banister, A., Bricklebank, N., Clegg, W., Elsegood, M., Gregory, C., Lavender, I., Rawson, J., & Tanner, B. (online). The First Solid-state Paramagnetic 1,2,3,5-dithiadiazolyl Radical - X-ray Crystal-structure Of [p-ncc6f4cnssn]center-dot. Journal of the Chemical Society. Chemical communications, 679-680
Critical Thickness Of Quantum-well Structures: Modified Matthews-blakeslee Formula And Experimental Support Gathered By Means Of Synchrotron X-ray Reflection Topography
Journal Article
Mock, P., Tanner, B., Lacey, G., Whitehouse, C., & Smith, G. (online). Critical Thickness Of Quantum-well Structures: Modified Matthews-blakeslee Formula And Experimental Support Gathered By Means Of Synchrotron X-ray Reflection Topography. Institute of physics conference series, 165-168
Computer-simulation Of X-ray Topographs Of Curved Silicon-crystals
Journal Article
Green, G., & Tanner, B. (online). Computer-simulation Of X-ray Topographs Of Curved Silicon-crystals. Institute of physics conference series, 627-632
Preparation And Characterization Of The Mixed 1,3,2,4-dithiadiazolylium/1,2,3,5-dithiadiazolylium Salts And Related Free-radicals - [m-snsnc-c6h4-cnssn]x And [p-snsnc-c6h4-cnssn]x (x = 2+, .+ Or 2.)
Journal Article
Banister, A., Lavender, I., Rawson, J., Clegg, W., Tanner, B., & Whitehead, R. (online). Preparation And Characterization Of The Mixed 1,3,2,4-dithiadiazolylium/1,2,3,5-dithiadiazolylium Salts And Related Free-radicals - [m-snsnc-c6h4-cnssn]x And [p-snsnc-c6h4-cnssn]x (x = 2+, .+ Or 2.). Journal of the Chemical Society. Dalton transactions, 1421-1429
X-ray Scattering For Semiconductor Characterisation
Journal Article
Tanner, B. (online). X-ray Scattering For Semiconductor Characterisation