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Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity (1988)
Journal Article
Lucas, C., Hatton, P., Bates, S., Ryan, T., Miles, S., & Tanner, B. (1988). Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity. Journal of Applied Physics, 63, 1936-1941