An industry-based survey of reliability in power electronic converters

Yang, S; Bryant, A; Mawby, PA; Xiang, D; Ran, L; Tavner, PJ

doi:10.1109/tia.2011.2124436

All Outputs (2)

Investigation Into IGBT dV/dt During Turn-Off and Its Temperature Dependence (2011)
Journal Article
Bryant, A., Yang, S., Mawby, P., Xiang, D., Ran, L., Tavner, P., & Palmer, P. (2011). Investigation Into IGBT dV/dt During Turn-Off and Its Temperature Dependence. IEEE Transactions on Power Electronics, 26(10), 3019-3031. https://doi.org/10.1109/tpel.2011.2125803

An industry-based survey of reliability in power electronic converters (2011)
Journal Article
Yang, S., Bryant, A., Mawby, P., Xiang, D., Ran, L., & Tavner, P. (2011). An industry-based survey of reliability in power electronic converters. IEEE Transactions on Industry Applications, 47(3), 1441-1451. https://doi.org/10.1109/tia.2011.2124436

A questionnaire survey was carried out to determine the industrial requirements and expectations of reliability in power electronic converters. The survey was subjective and conducted with a number of high-profile semiconductor manufacturers, integra... Read More about An industry-based survey of reliability in power electronic converters.