IW Archibald
Experimental determination of the density of gap states in amorphous silicon by Schottky barrier admittance.
Archibald, IW; Abram, RA
Citation
Archibald, I., & Abram, R. (1987). Experimental determination of the density of gap states in amorphous silicon by Schottky barrier admittance. Philosophical Magazine B, 56, 429-441
| Journal Article Type | Article |
|---|---|
| Publication Date | 1987 |
| Journal | Philosophical Magazine B |
| Print ISSN | 1364-2812 |
| Electronic ISSN | 1463-6417 |
| Publisher | Taylor and Francis |
| Volume | 56 |
| Pages | 429-441 |
| Public URL | https://durham-repository.worktribe.com/output/1613070 |
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